The IEC 60749 series of mechanical and climatic test methods is a 42 part series that covers a range of
tests from the general to the nuanced. Together, IEC 60749 presents a thorough test method for
semiconductor devices of many sorts, for use in varied environments and industries, with devices subjected to the degree of testing that is required of them.
Semiconductor Reliability Standards include tests for electrostatic discharge (ESD), radiation-hardness, longevity and life-span estimations through accelerated testing, as well as other varied tests for semiconductors and semiconductor devices.