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ANSI/ESD SP5.5.2-2007

Electrostatic Discharge Sensitivity Testing - Very Fast Transmission Line Pulse (VF-TLP) - Component Level

This document pertains to Very Fast Transmission Line Pulse (VF-TLP) testing techniques of semiconductor components. It establishes guidelines and standard practices presently used by development, research, and reliability engineers in both universities and industry for VF-TLP testing. This document explains a methodology for both testing and reporting information associated with VF-TLP testing.

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Electrostatic Discharge Association [esda]

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