Historical
IEC 60749-12 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.
International Electrotechnical Commission [iec]