IEC 60749-23 Amd.1 Ed. 1.0 b:2011

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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

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IEC 60749-23 Amd.1 Ed. 1.0 b:2011

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

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