IEC 60749-6 Ed. 1.0 b:2002

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Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

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International Electrotechnical Commission [iec]

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Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

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Historical

IEC 60749-6 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Are the documents at the ANSI Webstore in electronic Adobe Acrobat PDF format only?

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