Historical
IEC 60749-7 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
CONTENT PROVIDER
International Electrotechnical Commission [iec]
International Electrotechnical Commission [iec]