IEC 60749-5 Ed. 1.0 b:2003

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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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IEC 60749-5 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Are the documents at the ANSI Webstore in electronic Adobe Acrobat PDF format only?

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