IEC 60749-4 Ed. 1.0 b Cor.1:2003

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"Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)"

Modification of the validity date: now put at 2007.

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"Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)"

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IEC 60749-4 Ed. 1.0 b Cor.1:2003

"Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)"

Are the documents at the ANSI Webstore in electronic Adobe Acrobat PDF format only?

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