IEC 62374-1 Ed. 1.0 b:2010

Name: IEC 62374-1 Ed. 1.0 b:2010
Brand: IEC
SKU: IEC 62374-1 Ed. 1.0 b:2010
Price: 103.00 USD
Availability: InStock

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Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

"IEC 62374-1:2010 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices."

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International Electrotechnical Commission [iec]

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Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

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