The IEC 60747 series of semiconductor standards covers discrete devices, integrated circuits, semiconductor sensors, microwave integrated circuits, and others as part of its 28 part series. These devices are used as the building blocks for a wide range of more complicated devices, so standardization at this level directly contributes to the standardization of levels further down the design and fabrication process.
The IEC 61290, 61291, and 61292 series focuses on optical amplifiers, including those based on semiconductors (SOAs). IEC 61290 is a 22 part series covering methodology of analysis using optical amplifiers. IEC 61291 contains general and performance specifications. Lastly, IEC 61292 is a series of technical reports (IEC/TR) that provides additional information.
The IEC 62047 series of semiconductor standards concerns itself with micro-electromechanical devices, also known as MEMS. This 22 standard series starts from the basics with terms, definitions, and general specs, and continues on to a range of measurements and test methods such as those for fatigue, compression, bending, and shearing.
Semiconductor Device Standards also cover devices outside of those large series. Smaller IEC series and those from other standards developing organizations provide further information about other devices using semiconductors, such as HVDC systems, switchgear/controlgear, X-ray machines, fiber optics, and others.
As the voice of the U.S. standards and conformity assessment system, the American National Standards Institute (ANSI) empowers its members and constituents to strengthen the U.S. marketplace position in the global economy while helping to assure the safety and health of consumers and the protection of the environment.