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EM Immunity

Semiconductor Fabrication Standards cover the production process of semiconductors. Given the importance of clean rooms, these standards address gas distribution in that context, as well as the use and quality of water. Additionally, IEC 62258 provides information about semiconductor die products. Other topics of importance are included as well, such as EM immunity, examination of semiconductors, and aerospace-specific requirements.

CISPR 14-1 Ed. 7.0 en:2020

Electromagnetic compatibility - Requirements for household appliances, electric tools and similar apparatus - Part 1: Emission

CISPR 14-1:2020 specifies the requirements that apply to the emission of radio-frequency disturbances in the frequency range 9 kHz to 400 GHz from appliances, electric tools and similar apparatus as defined below, whether powered by AC or DC (including a battery). This document is applicable to the following equipment: - household appliances or similar equipment; - electric tools; - similar apparatus. Also included in the scope of this document are separate parts of the above mentioned equipment such as motors and switching devices (e.g. power or protective relays). However, no emission requirements apply to such separate parts, unless otherwise stated in this document. Products which incorporate radio transmit/receive functions are included in the scope of this document. Equipment under the scope of this document making use of IPT is also in the scope. Excluded from the scope of this document are: - equipment for which all emission requirements in the radio-frequency range are explicitly formulated in other CISPR standards; - equipment intended to be used only on a vehicle, ship or aircraft; - equipment used only in industrial environment - the effects of electromagnetic phenomena relating to the safety of the equipment. Multifunction equipment may be required to comply with clauses in this and other standards. The details are given in 6.5. The emission requirements in this document are not intended to be applicable to the intentional transmissions from a radio transmitter as defined by the ITU including their spurious emissions. This seventh edition cancels and replaces the sixth edition published in 2016. This edition constitutes a technical revision. This edition includes the following significant changes with respect to the previous edition: - extension of the frequency range for radiated measurements above 1 GHz; - revision of general test conditions and addition of new specific test conditions (e.g. for robotic equipment); - introduction of additional requirements for equipment making use of inductive power transfer technology; - remove from the normative text any compliance requirement based on statistical evaluation; - revision of clicks analysis, with particular relevance to the determination of the observation time and the application of the upper quartile method for different types of click analysers. Refer to the Foreword of the document for examples of equipment.

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IEC 62132-3 Ed. 1.0 b:2007

"Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method"

"This part of IEC 62132 describes a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method only applies to ICs that have off-board wire connections e.g. into a cable harness. This test method is used to inject RF current on one or a combination of wires. This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals. "

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IEC 62132-4 Ed. 1.0 b:2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.

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