The IEC 60749 series of mechanical and climatic test methods is a 42 part series that covers a range of tests from the general to the nuanced. Together, IEC 60749 presents a thorough test method for semiconductor devices of many sorts, for use in varied environments and industries, with devices subjected to the degree of testing that is required of them.
Semiconductor Reliability Standards include tests for electrostatic discharge (ESD), radiation-hardness, longevity and life-span estimations through accelerated testing, as well as other varied tests for semiconductors and semiconductor devices.
As the voice of the U.S. standards and conformity assessment system, the American National Standards Institute (ANSI) empowers its members and constituents to strengthen the U.S. marketplace position in the global economy while helping to assure the safety and health of consumers and the protection of the environment.