Historical
IEC 60749-13 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
CONTENT PROVIDER
International Electrotechnical Commission [iec]
International Electrotechnical Commission [iec]