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Reliability and Other Semiconductor Standards

Semiconductor Reliability Standards include tests for electrostatic discharge (ESD), radiation-hardness, longevity and life-span estimations through accelerated testing, as well as other varied tests for semiconductors and semiconductor devices.

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Radiation
Reliability
Tests
ESD

Radiation

ASTM E722-19
ASTM E720-16
ASTM E721-22
ASTM F1190-24
ASTM F1192-24
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Reliability

IEC 62374 Ed. 1.0 b:2007
IEC 62374-1 Ed. 1.0 b:2010
SAE SSB 1/001-2014 (SAE SSB1/001-2014)
SAE SSB 1/003A-2014 (SAE SSB1/003A-2014)
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Tests

IEC 62137-4 Ed. 1.0 b:2014
ASTM F615M-95(2013)
ASTM F1894-98(2011)
ASTM E493/E493M-11(2022)
IEC 62483 Ed. 1.0 b:2013
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ESD

IEC 61340-3-1 Ed. 2.0 b:2006
IEC 61340-3-2 Ed. 2.0 b:2006
IEC 62615 Ed. 1.0 b:2010
ANSI/ESD STM5.5.1-2022
ANSI/ESD SP5.5.2-2007
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