IEC/TS 62607-6-14 Ed. 1.0 en:2020

Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy

IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic
 • defect level
 for powders consisting of graphene-based material by
 • Raman spectroscopy.
 The defect level is derived by the intensity ratio of the D+D band and 2D band in Raman spectrum, ID+D /I2D.
 • The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
 • The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
 • Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
 • The method described in this document is appropriate if the physical form of graphene is powder.