1450-1999

Standard Test Interface Language (STIL) for Digital Test Vector Data

This project is to define a standard language that a) facilitates the transfer of large volumes of digital test information from computer Aided-Engineering (CAE) environments to Automated Test Equipment (ATE) environments; b) specifies pattern, format, and timing information sufficient to define the application of test vectors to a Device Under Test (DUT); c) supports the large bulk test information generated from structured test and integral test techniques for very large scale and ultra large scale integrated circuit designs in a format optimized for transportation and application in Automated Test Equipment (ATE) environments; d) supports device testing for integrated circuit, very large scale and ultra large scale integrated circuit test environments, but not restricted from application to other digital test environments.