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ANSI N42.31-2003

Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

Measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium-telluride (CdTe) cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays and charged particles. Standard terminology and descriptions of the principal features of the detectors are included.

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