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IPC/JEDEC J-STD-035A-2022
Acoustic Microscopy for Nonhermetic Encapsulated Electronics Devices
IPC/JEDEC J-STD-035A test method defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic devices. IPC/JEDEC J-STD-035A method provides users with an acoustic microscopy process flow for detecting anomalies (delaminations, cracks, mold compound voids, etc.) nondestructively in encapsulated electronic devices while achieving reproducibility
Association Connecting Electronics Industries [ipc]