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ANSI/ESD SP5.3.3-2018

Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) Testing - Component Level Low - Impedance Contact CDM as an Alternative CDM Characterization Method

This standard practice establishes the procedure for testing devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined contact CDM electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices can be characterized according to this standard practice.


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Electrostatic Discharge Association [ESDA]


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