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DS/EN IEC 63287-1:2021
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
This part of IEC 63287-1 gives guidelines for reliability qualification plans of large *scale semiconductor integrated circuit products (LSI). This document is not intended for *military- and space-related applications.**NOTE 1 – The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable *reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant *document can also be applicable if it is specified.**NOTE 2 – The Weibull distribution method used in this document is one of several *methods to calculate the appropriate sample size and test conditions of a given reliability *project.*
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