IEC 60749-17 Ed. 1.0 b:2003

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Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

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Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

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Historical

IEC 60749-17 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Are the documents at the ANSI Webstore in electronic Adobe Acrobat PDF format only?

Useful Links

CUSTOMER SERVICE

Our Contacts