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IEC 60749-29 Ed. 2.0 b:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
"IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing ""no trouble found"" (NTF) and ""electrical overstress"" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:
- a number of minor technical changes;
- the addition of two new annexes covering the testing of special pins and temperature calculations. "
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International Electrotechnical Commission [iec]
