Most recent
IEC 60749-31 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
- ADD TO ALERT |
- PDF |
International Electrotechnical Commission [iec]
