Historical

IEC 60749-4 Ed. 1.0 b Cor.1:2003

"Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)"

Modification of the validity date: now put at 2007.

CONTENT PROVIDER
International Electrotechnical Commission [iec]

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Amendments & Corrections