Historical

IEC 61649 Ed. 1.0 b:1997

Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed dat

Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.

CONTENT PROVIDER
International Electrotechnical Commission [iec]

Others Also Bought
Reliability growth - Statistical test and estimation methods
Standard Practice for Factors and Procedures for Applying the MIL-STD-105 Plans in Life and Reliability Inspec ...
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and chara ...
Included in Packages
This standard is not included in any packages.
Document History
Amendments & Corrections
We have no amendments or corrections for this standard.