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IEEE C62.59-2019
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations, or network operators.
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Institute of Electrical and Electronics Engineers [ieee]
