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IPC/JEDEC J-STD-035A-2022
Acoustic Microscopy for Nonhermetic Encapsulated Electronics Devices
IPC/JEDEC J-STD-035A test method defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic devices. IPC/JEDEC J-STD-035A method provides users with an acoustic microscopy process flow for detecting anomalies (delaminations, cracks, mold compound voids, etc.) nondestructively in encapsulated electronic devices while achieving reproducibility
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Association Connecting Electronics Industries [ipc]