Historical

ISO 17470:2004

Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

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International Organization for Standardization [iso]

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