SAE J 1752-2-2016 (SAE J1752-2-2016)

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Measurement of Radiated Emissions from Integrated Circuits - Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz (Stabilized: Sep 2016)

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Measurement of Radiated Emissions from Integrated Circuits - Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz (Stabilized: Sep 2016)

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SAE J 1752-2-2016 (SAE J1752-2-2016)

Measurement of Radiated Emissions from Integrated Circuits - Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz (Stabilized: Sep 2016)

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