Carbon nanotubes nanotechnology standards, which address carbon atoms arranged in the shape of a hollow cylinder, are published by ISO. These structures are known for their electrical conductivity, tensile strength, and thermal conductivity, and they have applications in the fields of electronics and fiber optics. This list of standards address carbon nanotubes in the context of nanotechnology in regards to different applications such as transmission electron microscopy, mesoscopic shape factors, and many other specialized topics. Because the generation of these nanotubes requires precise processes and a significant investment, it is best to protect those investments by arming those who work with them with the standardized knowledge that many professionals use in the field.
ISO/TS 11888:2017 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM), transmission electron microscopy (TEM), viscometry, and light scattering analysis. ISO/TS 11888:2017 also includes additional terms needed to define the characterization of static bending persistence length (SBPL). Measurement methods are given for the evaluation of SBPL, which generally varies from several tens of nanometres to several hundred micrometres. Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.
ISO/TR 10929:2012 identifies the basic properties of multiwall carbon nanotubes (MWCNTs) and the content of impurities, which characterize bulk samples of MWCNTs, and highlights the major measurement methods available to industry for the determination of these parameters. ISO/TR 10929:2012 provides a sound basis for the research, development and commercialization of these materials.
ISO/TS 10868:2017 provides guidelines for the characterization of compounds containing single-wall carbon nanotubes (SWCNTs) by using optical absorption spectroscopy. The aim of this document is to describe a measurement method to characterize the diameter, the purity, and the ratio of metallic SWCNTs to the total SWCNT content in the sample. The analysis of the nanotube diameter is applicable for the diameter range from 1 nm to 2 nm.
ISO/TS 10798:2011 establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis. The methods described in ISO/TS 10798:2011 for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).
ISO/TS 10797:2012 establishes methods for characterizing the morphology of single-wall carbon nanotubes (SWCNTs) and identifying the elemental composition of other materials in SWCNT samples, using transmission electron microscopy and chemical analysis by energy dispersive X-ray spectrometry.
This document gives guidelines for the characterization of carbon nanotube (CNT)-containing samples by thermogravimetric analysis (TGA), performed in either an inert or oxidizing environment. Guidance is provided on the purity assessment of the CNT samples through a quantitative measure of the types of carbon species present as well as the non-carbon impurities (e.g. metal catalyst particles) within the material. In addition, this technique provides a qualitative assessment of the thermal stability and homogeneity of the CNT-containing sample. Additional characterization techniques are required to confirm the presence of specific types of CNT and to verify the composition of the metallic impurities present.
This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy. It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities. The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.
This document specifies a method for the characterization of evolved gas components in single-wall carbon nanotube (SWCNT) samples using evolved gas analysis/gas chromatograph mass spectrometry (EGA/GCMS). NOTE Some difference could appear between qualitative and quantitative results of emitted gas and gas content in the sample due to the heating and the possible presence of catalysts.