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MIL-STD-750-3(1) NOT 1
Transistor Electrical Test Methods for Semiconductor Devices Part 3: Test Methods 3000 Through 3999
Part 3 of this test method standard establishes uniform test methods for the electrical testing of semiconductor transistors to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, rectifiers, thryristors, and other related electronic components. This part of a multipart test method standard is intended to apply only to semiconductor devices.
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Department of Defense [dod]
