Most recent

IEC 60444-2 Ed. 1.0 b:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

CONTENT PROVIDER
International Electrotechnical Commission [iec]

Others Also Bought
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for ...
Included in Packages
This standard is not included in any packages.
Document History
We have no document history for this standard.
Amendments & Corrections
We have no amendments or corrections for this standard.