IEC 60749-12 Ed. 1.0 b:2002

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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.

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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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Historical

IEC 60749-12 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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