Customer Service:
Mon - Fri: 8:30 am - 6 pm EST

 Most recent

IEC 60749-12 Ed. 2.0 b:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
 This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
 a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.
 


Content Provider
International Electrotechnical Commission [iec]


Others Also Bought

Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface ...
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Included in Packages
This standard is not included in any packages.
Amendments & Corrections
We have no amendments or corrections for this standard.
ANSI Logo

As the voice of the U.S. standards and conformity assessment system, the American National Standards Institute (ANSI) empowers its members and constituents to strengthen the U.S. marketplace position in the global economy while helping to assure the safety and health of consumers and the protection of the environment.

CUSTOMER SERVICE
NEW YORK OFFICE
ANSI HEADQUARTERS