Most recent

IEC 60749-13 Ed. 2.0 b:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
 This edition includes the following significant technical changes with respect to the previous edition:
 a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

CONTENT PROVIDER
International Electrotechnical Commission [iec]

Others Also Bought
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Included in Packages
This standard is not included in any packages.
Amendments & Corrections
We have no amendments or corrections for this standard.