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IEC/TS 62607-6-11 Ed. 1.0 en:2022
Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy
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International Electrotechnical Commission [iec]