Most recent

IEC/TS 62607-6-2 Ed. 1.0 en:2023

Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy


IEC TS 62607-6-2:2023 establishes a standardized method to determine the key control characteristic
 - number of layers
 for graphene flakes by a combination of
 - atomic force microscopy,
 - optical transmission, and
 - Raman spectroscopy


CONTENT PROVIDER
International Electrotechnical Commission [iec]

Document History
We have no document history for this standard.
Included in Packages
This standard is not included in any packages.
Amendments & Corrections
We have no amendments or corrections for this standard.