Most recent

IEC 61649 Ed. 2.0 b:2008

Weibull analysis


"IEC 61649:2008 provides methods for analysing data from a Weibull distribution using continuous parameters such as time to failure, cycles to failure, mechanical stress, etc. This standard is applicable whenever data on strength parameters, e.g. times to failure, cycles, stress, etc. are available for a random sample of items operating under test conditions or in-service, for the purpose of estimating measures of reliability performance of the population from which these items were drawn. The main changes with respect to the previous edition are as follows: the title has been shortened and simplified to read ""Weibull analysis""; and provision of methods for both analytical and graphical solutions have been added."


CONTENT PROVIDER
International Electrotechnical Commission [iec]

Others Also Bought
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
Reliability stress screening - Part 2: Components
Equipment reliability testing. Statistical procedures for exponential distribution. Point estimates, confidence ...
Document History
Included in Packages
This standard is not included in any packages.
Amendments & Corrections
We have no amendments or corrections for this standard.