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Semiconductor Device Standards also cover devices outside of those large series. Smaller IEC series and those from other standards developing organizations provide further information about other devices using semiconductors, such as HVDC systems, switchgear/controlgear, X-ray machines, fiber optics, and others.
ANSI N42.31-2003
Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
Measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium-telluride (CdTe) cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays and charged particles. Standard terminology and descriptions of the principal features of the detectors are included.
ASTM E1894-24
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
1.1 This guide provides assistance in selecting and using dosimetry systems in flash X-ray experiments. Both dose and dose rate techniques are described. 1.2 Operating characteristics of flash X-ray sources are given, with emphasis on the spectrum of the photon output. 1.3 Assistance is provided to relate the measured dose to the response of a device under test (DUT). The device is assumed to be a semiconductor electronic part or system. 1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
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IEC 61674 Ed. 3.0 b:2024
Medical electrical equipment - Dosimeters with ionization chambers and/or semiconductor detectors as used in X-ray diagnostic imaging
IEC 61674:2024 specifies the performance and some related constructional requirements of DIAGNOSTIC DOSIMETERS intended for the measurement of AIR KERMA, AIR KERMA LENGTH PRODUCT or AIR KERMA RATE, in photon radiation fields used in medical X-ray imaging, such as RADIOGRAPHY, RADIOSCOPY and COMPUTED TOMOGRAPHY (CT), for X-RADIATION with generating potentials in the range of 20 kV to 150 kV. This document is applicable to the performance of DOSIMETERS with VENTED IONIZATION CHAMBERS and/or SEMICONDUCTOR DETECTORS as used in X-ray diagnostic imaging. IEC 61674:2024 cancels and replaces the second edition published in 2012. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) for mammography, the manufacturer specifies the REFERENCE VALUE for the RADIATION QUALITY; b) for mammography, the manufacturer provides the MINIMUM RATED RANGE of RADIATION QUALITIES for the compliance test on energy dependence of response; c) the compliance test for analogue displays was removed; d) the compliance tests for range reset, the effect of leakage and recombination losses were removed. These tests are already covered by the test on linearity and cannot be conducted for modern devices. The estimation of COMBINED STANDARD UNCERTAINTY was changed accordingly; e) the compliance test for mains rechargeable and battery-operated dosimeters were updated for modern devices
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ASTM D7751-16(2021)
Standard Test Method for Determination of Additive Elements in Lubricating Oils by EDXRF Analysis
1.1 This test method covers the quantitative determination of additive elements in unused lubricating oils and additive packages, as shown in Table 1 . 1.2 Additive packages require dilution with a contamination free diluent (base oil) prior to analysis. The dilution factor has to be calculated from the expected concentrations to bring the concentrations for all elements into the ranges listed in Table 1 . 1.3 Some lubrication oils will contain higher concentrations than the maximum concentrations listed in Table 1 . These samples require dilution with a contamination free diluent (base oil) prior to analysis. The dilution factor has to be calculated from the expected concentrations to bring the concentrations for all elements into the ranges listed in Table 1 . 1.4 This test method is limited to the use of energy dispersive X-ray fluorescence (EDXRF) spectrometers employing an X-ray tube for excitation in conjunction with the ability to separate the signals of adjacent elements by using a high resolution semiconductor detector. 1.5 This test method uses inter-element correction factors calculated from a fundamental parameters (FP) approach or from another matrix correction method. 1.6 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.6.1 The preferred concentration units are mg/kg or mass %. 1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.8 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
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IEC 60759 Ed. 1.0 b:1983
Standard test procedures for semiconductor X-ray energy spectrometers
Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.
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